From the Wires
inTEST to Participate in Two Investor Conferences
Sidoti Annual New York Micro Cap Conference (New York, NY); 15th Annual Needham Growth Conference (New York, NY)
Jan. 4, 2013 02:01 PM
MOUNT LAUREL, NJ -- (Marketwire) -- 01/04/13 -- inTEST Corporation (NASDAQ: INTT), an independent designer, manufacturer and marketer of temperature management products and semiconductor automatic test equipment (ATE) interface solutions, today announced that the company's management will participate in the following investor conferences: Sidoti Annual New York Micro Cap Conference and the 15th Annual Needham Growth Conference. At each event, Robert Matthiessen, President and CEO, and Hugh Regan, Jr., CFO, will provide an overview of the Company and will discuss its competitive position and future prospects. Interested parties are invited to access the company's presentation materials for either event on the Investor Relations section of the inTEST website at www.intest.com.
Sidoti Annual New York Micro Cap Conference: New York, NY - January 7, 2013
Mr. Matthiessen and Mr. Regan will participate in Sidoti's Annual New York Micro Cap Conference. inTEST's presentation will take place on Monday, January 7, 2013 at 2:50 PM EST at the Grand Hyatt Hotel in New York City. Management will also conduct one-on-one meetings with investors at the conference.
Sidoti & Co. does not offer the option of webcasting individual company presentations. The slides for the inTEST presentation will be posted on the investor relations section of the inTEST corporate website at www.intest.com.
For more information about the Sidoti conference or to schedule a one-on-one meeting with inTEST Corporation management, please contact your Sidoti & Co representative directly or Laura Guerrant at Guerrant Associates (808) 882-1467 or via email at lguerrant@guerrantir.com.
15th Annual Needham Growth Conference: New York, NY - January 17, 2013
Mr. Matthiessen and Mr. Regan will participate in the 15th Annual Needham Growth Conference. inTEST's presentation will take place on Thursday, January 17, 2013 at 2:10 PM EST at the Palace Hotel in New York City. Management will also conduct one-on-one meetings with investors at the conference.
The audio portion of inTEST's presentation at the Needham Growth Conference will be webcast live. Interested investors can access the live audio webcast at http://wsw.com/webcast/needham55/intt/. The audio webcast will be archived for 90 days following the live presentation.
The slides for the inTEST presentation will be posted on the investor relations section of the inTEST corporate website at www.intest.com.
For more information about the Needham conference or to schedule a one-on-one meeting with inTEST Corporation management, please contact your Needham & Co representative directly or Laura Guerrant at Guerrant Associates (808) 882-1467 or via email at lguerrant@guerrantir.com.
About inTEST Corporation
inTEST Corporation is an independent designer, manufacturer and marketer of temperature management products and ATE interface solutions, which are used by semiconductor manufacturers to perform final testing of integrated circuits (ICs) and wafers. The Company's high-performance products are designed to enable semiconductor manufacturers to improve the speed, reliability, efficiency and profitability of IC test processes. Specific products include positioner and docking hardware products, temperature management systems and customized interface solutions. The Company has established strong relationships with semiconductor manufacturers globally, which it supports through a network of local offices. For more information visit www.intest.com.
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