From the Wires
Forensic Elite to Meet in Washington, D.C. for Scientific Meeting in February - Meeting Marks 65th Anniversary of American Academy of Forensic Sciences
By: PR Newswire
Jan. 16, 2013 01:00 PM
COLORADO SPRINGS, Colo., Jan. 16, 2013 /PRNewswire/ -- The American Academy of Forensic Sciences (AAFS) 65th annual scientific meeting is scheduled for February 18-23, 2013 at the Marriott Wardman Park Hotel in Washington, D.C. Themed "The Forensic Sciences: Founded on Observation and Experience – Improved by Education and Research" by Academy President Robert E. Barsley, DDS, JD, more than 4,000 professionals representing all 50 United States, Canada and 62 other countries worldwide will convene to address issues facing forensic science, global cooperation and consensus building among forensic professionals, and improving the forensic sciences through education and research.
Forensic scientists will present the most current information, research and updates in their fields. More than 800 scientific papers, seminars, workshops and special sessions will address topics ranging from forensic psychiatry and behavioral sciences to interdisciplinary approaches to forensic science investigations using physical evidence.
Highlights of the meeting include the AAFS Student Academy, an educational community outreach program for high school students, held on Tuesday, Feb. 19. Local students from area high schools will learn from hands-on experience with experts representing 11 disciplines of forensic sciences. The Student Academy program is presented each year during the scientific meeting and has introduced hundreds of students to this highly popular and growing career field.
The opening Plenary Session entitled "The Forensic Sciences: Founded on Observation and Experience – Improved by Education and Research," addresses how the profession grows and improves through education of forensic scientists, validation and adoption of new technologies and methods, and cutting edge research to ensure that accurate, valid and transparent forensic results form the foundation for 21st century forensic science.
The scientific meeting concludes with an all-day seminar offered to the public, entitled "Forensics: Solving Crimes the Experts' Way," at 9:30 a.m., Saturday, Feb. 23, at the Smithsonian's S. Dillon Ripley Center, presented in partnership with the Smithsonian Associates. Members of AAFS, including Henry C. Lee, PhD, Linda Kenney Baden, JD, and Barry C. Scheck, JD, will discuss vexing questions and challenges from famous case files, forensic tests in the courtroom, cold case breakthroughs, and research and assessment of unresolved homicides. Tickets are available at www.smithsonianassociates.org
COMPLIMENTARY REGISTRATION FOR THE MEDIA: Individuals able to document a current direct connection with the news media may receive free registration at the AAFS Registration Desk, as may journalism students by presenting letterhead-stationary certification that they are attending as part of a class activity. All persons seeking access to any aspect of the Annual Meeting must be registered. Press attending special functions (e.g., workshops, seminars, luncheons) are required to pre-register and pay the fees designated by the pre-registration deadline.
The American Academy of Forensic Sciences is a multi-disciplinary professional organization that provides leadership to advance science and its application to the legal system. The objectives of the Academy are to promote integrity, competency, education, foster research, improve practice, and encourage collaboration in the forensic sciences. Organized in 1948, AAFS serves a distinguished and diverse membership of 6,000 forensic science professionals who are the focal point for public information when forensic science issues are addressed in the public domain. AAFS publishes the internationally recognized Journal of Forensic Sciences. For more information visit www.aafs.org.
SOURCE American Academy of Forensic Sciences
Latest Cloud Developer Stories
Subscribe to the World's Most Powerful Newsletters
Subscribe to Our Rss Feeds & Get Your SYS-CON News Live!
SYS-CON Featured Whitepapers
Most Read This Week